• DocumentCode
    2608242
  • Title

    Thermal behavior of simulated chips during power-off transient period

  • Author

    Bhowmik, H. ; Tso, C.P. ; Tou, K.W.

  • Author_Institution
    Sch. of Mech. & Production Eng., Nanyang Technol. Univ., Singapore
  • fYear
    2003
  • fDate
    10-12 Dec. 2003
  • Firstpage
    497
  • Lastpage
    500
  • Abstract
    Experiments are conducted to study the heat transfer characteristics from an array of 4×1 flush mounted simulated electronic chips using water as the working fluid in a vertical up-flow rectangular channel. The data covers a range of laminar flow data with Reynolds number based on heat source length ranging from 1050 to 2625 for an inlet water temperature of about 23°C. The applied uniform heat fluxes to the chips are 2, 4, 6 and 8 W/cm2. Steady state results are obtained to ensure that the test rig is in good working condition. Experiments are then extended to study the transient heat transfer regime for 75 s after the heater power is cut-off, keeping the coolant pump power on. The effects of heat flux, coolant flow rates and geometric parameters such as chip numbers are investigated. Finally, the correlation equations are presented for individual chips as well as for overall data in the transient regime.
  • Keywords
    cooling; integrated circuit packaging; laminar flow; thermal analysis; thermal management (packaging); transient response; 23 degC; 75 s; chip power-off transient period; coolant flow rate; correlation equations; dielectric fluids; direct liquid cooling; flush mounted chips; heat flux; inlet water temperature; laminar flow; simulated chip thermal behavior; thermal management; transient heat transfer; transient thermal behavior; vertical up-flow rectangular channel; water working fluid; Coolants; Employee welfare; Equations; Heat pumps; Heat transfer; Steady-state; Temperature distribution; Testing; Water heating; Water resources;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology, 2003 5th Conference (EPTC 2003)
  • Print_ISBN
    0-7803-8205-6
  • Type

    conf

  • DOI
    10.1109/EPTC.2003.1271571
  • Filename
    1271571