DocumentCode :
2608366
Title :
Designing parameters for RF MOS cells
Author :
Srivastava, Viranjay M. ; Singh, G. ; Yadav, K.S.
Author_Institution :
Electron. & Commun. Eng. Dept., Jaypee Univ. of Inf. Technol., Solan, India
fYear :
2010
fDate :
27-29 Dec. 2010
Firstpage :
259
Lastpage :
262
Abstract :
Demand of radio frequency switches using Metal-Oxide-Semiconductor (MOS) technology at high-frequencies for wireless telecommunication system is increasing drastically. This paper presents the results for the development of a cell library that includes the basics of the design parameters for n-MOS transistor and p-MOS transistor to design a RF CMOS switch. The cell library design includes the properties for RF circuit design standard and measurement outcomes are presented. The cell parameters presented here are calculated (designed) using 2.0 μm and 0.8 μm technology MOS integrated circuit. In this paper we discussed and found better result in terms of drain current for gate voltage of 2.1 V compare to 1.2 V, calculate the power for these voltages and time constant with help of contact resistance and capacitances.
Keywords :
CMOS integrated circuits; MMIC; UHF integrated circuits; capacitance; contact resistance; microwave switches; RF CMOS switch; RF MOS cells; capacitance; cell library; contact resistance; metal oxide semiconductor technology; n-MOS transistor; p-MOS transistor; radio frequency switch; size 0.8 mum; size 2 mum; voltage 2.1 V; wireless telecommunication; Conferences; Industrial electronics; Radio frequency; Service robots; Cell Library; Contact resistance of MOS; MOSFET; Radio Frequency; VLSI; Voltage-Current Curve;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, Control & Robotics (IECR), 2010 International Conference on
Conference_Location :
Orissa
Print_ISBN :
978-1-4244-8544-4
Type :
conf
DOI :
10.1109/IECR.2010.5720126
Filename :
5720126
Link To Document :
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