Mixed-mode S-parameter characterization of differential structures

Author

Fan, W. ; Lu, Albert ; Wai, L.L. ; Lok, B.K.

Author_Institution

Joining Technol. Group, Singapore Inst. of Manuf. Technol., Singapore

fYear

2003

fDate

10-12 Dec. 2003

Firstpage

533

Lastpage

537

Abstract

Combined differential-mode and common-mode (mixed-mode) scattering parameters (S-parameters) are well adapted to accurate measurements of linear networks at RF and microwave frequencies. The relationships between standard S-parameters with two-port vector network analyzer (VNA) and mixed-mode S-parameters with four-port VNA are derived in this paper. An example differential structure was measured with standard two-port VNA and mixed-mode four-port VNA. The correlation of standard s-parameters and mixed-mode S-parameters is presented as well.

Keywords

S-parameters; linear network analysis; microwave circuits; microwave reflectometry; multiport networks; two-port networks; common-mode scattering parameters; differential structure; differential-mode scattering parameters; four-port vector network analyzer; linear networks; mixed-mode S-parameter characterization; mode conversion; response waves matrix; stimulus waves matrix; two-port vector network analyzer; Frequency measurement; Impedance; Manufacturing; Microwave frequencies; Microwave measurements; Microwave technology; Radio frequency; Scattering parameters; Transmission line measurements; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Packaging Technology, 2003 5th Conference (EPTC 2003)

Print_ISBN

0-7803-8205-6

Type

conf

DOI

10.1109/EPTC.2003.1271579

Filename

1271579