• DocumentCode
    2608411
  • Title

    An automated visual inspection of solder joints using 2D and 3D features

  • Author

    Kim, Tae-Hyeon ; Cho, Tai-Hoon ; Moon, Young-Shik ; Park, Sung-Han

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Hanyang Univ., Ansan, South Korea
  • fYear
    1996
  • fDate
    2-4 Dec 1996
  • Firstpage
    110
  • Lastpage
    115
  • Abstract
    In this paper, efficient techniques for solder joint inspection have been described. Using three layers of ring shaped LED´s with different illumination angles, three frames of images are sequentially obtained. From these images the regions of interest (soldered regions) are segmented, and their characteristic features including the average gray level and the percentage of highlights-referred to as 2D features-are extracted. Based on the backpropagation algorithm of neural networks, each solder joint is classified into one of the pre-defined types. If the output value is not in the confidence interval, the distribution of tilt angles-referred to as 3D features-is calculated, and the solder joint is classified based on the Bayes classifier. The second classifier requires more computation while providing more information and better performance. The proposed inspection system has been implemented and tested with various types of solder joints in SMDs. The experimental results have verified the validity of this scheme in terms of speed and recognition rate
  • Keywords
    Bayes methods; automatic optical inspection; backpropagation; computer vision; neural nets; 2D features; 3D features; Bayes classifier; automated visual inspection; average gray level; backpropagation algorithm; highlights; neural networks; ring shaped LED´s; solder joint; solder joint inspection; tilt angles; Feature extraction; Image segmentation; Inspection; Lead; Light emitting diodes; Lighting; Moon; Shape; Soldering; Surface-mount technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Computer Vision, 1996. WACV '96., Proceedings 3rd IEEE Workshop on
  • Conference_Location
    Sarasota, FL
  • Print_ISBN
    0-8186-7620-5
  • Type

    conf

  • DOI
    10.1109/ACV.1996.572013
  • Filename
    572013