DocumentCode
2608432
Title
Do hot electrons produce excess noise?
Author
Jungemann, Christoph ; Meinerzhagen, Bernd
Author_Institution
NST, TU Braunschweig, Germany
fYear
2005
fDate
12-16 Sept. 2005
Firstpage
329
Lastpage
332
Abstract
The open question whether excess noise is due to hot electrons or not is addressed for the first time by solving the Langevin Boltzmann equation. Not only is the bulk case analyzed but also devices. In contrast to the well-known Monte Carlo method this new approach allows the investigation of the spatial origin of the terminal current noise. It is shown, that excess noise is mainly due to cold or warm electrons, whereas the contribution of hot electrons in a velocity-saturation region is negligible.
Keywords
Boltzmann equation; Monte Carlo methods; hot carriers; semiconductor device models; semiconductor device noise; Langevin Boltzmann equation; excess noise; hot electrons; terminal current noise; velocity-saturation region; Analysis of variance; Boltzmann equation; Electrons; Fluctuations; Heat transfer; Impedance; Lattices; Monte Carlo methods; Scattering; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European
Print_ISBN
0-7803-9203-5
Type
conf
DOI
10.1109/ESSDER.2005.1546652
Filename
1546652
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