Title :
Topological sensitivity analysis for steady State Eddy Current problems with an application to nondestructive testing
Author :
Li, Min ; Lowther, David A.
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
Abstract :
The topological gradient (TG) is derived for Steady state Eddy Current problem using a topological asymptotic expansion for the Maxwell equation of a Time Harmonic problem. TG provides information on where the design is most sensitive to topology changes. An application to eddy current nondestructive testing (NDT) is demonstrated.
Keywords :
Maxwell equations; crack detection; eddy current testing; harmonic analysis; topology; Maxwell equation; crack detection; nondestructive testing; steady state eddy current problems; time harmonic problem; topological asymptotic expansion; topological gradient; topological sensitivity analysis; Eddy currents; Electrical capacitance tomography; Magnetic flux leakage; Magnetic materials; Maxwell equations; Nondestructive testing; Sensitivity analysis; Shape; Steady-state; Topology;
Conference_Titel :
Electromagnetic Field Computation (CEFC), 2010 14th Biennial IEEE Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-7059-4
DOI :
10.1109/CEFC.2010.5481384
