• DocumentCode
    2608477
  • Title

    Room-temperature observation of large Coulomb-blockade oscillations from germanium Quantum-dot single-hole transistors with self-aligned electrodes

  • Author

    Chen, Gwong-Liang ; Lai, Wei-Ting ; Kuo, David M T ; Li, Pei-Wen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Central Univ., Chungli
  • fYear
    2007
  • fDate
    2-5 Aug. 2007
  • Firstpage
    1313
  • Lastpage
    1316
  • Abstract
    A single Ge quantum-dot (~10 nm) forms and self-aligns with source/drain electrodes via SiO2 tunneling barriers using thermal oxidation of a SiGe-on-insulator nanowire. Thereby, a Ge single-hole transistor with self-aligned electrodes is experimentally realized based on FinFET technology and features with clear Coulomb staircase/negative differential conductance and large Coulomb-blockade oscillation behaviors at room temperature. This work provides a simple approach to alleviate this nanofabrication bottleneck and thereby reduce series resistances and increase design freedom for SETs.
  • Keywords
    Coulomb blockade; Ge-Si alloys; MOSFET; electrodes; elemental semiconductors; germanium; nanotechnology; nanowires; oxidation; semiconductor quantum dots; silicon compounds; single electron transistors; tunnelling; Coulomb-blockade oscillation; FinFET technology; Ge; Si; SiGe-SiO2-Si; germanium quantum-dot; nanofabrication; nanowire; self-aligned electrodes; single electron transistor; single-hole transistors; size 10 nm; source-drain electrodes; temperature 293 K to 298 K; thermal oxidation; tunneling barriers; Electrodes; Etching; Fabrication; Germanium silicon alloys; Oxidation; Plasma applications; Quantum dots; Silicon germanium; Single electron transistors; Tunneling; Coulomb blockade; germanium; quantum dot; self-aligned electrodes; single electron transistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2007. IEEE-NANO 2007. 7th IEEE Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-0607-4
  • Electronic_ISBN
    978-1-4244-0608-1
  • Type

    conf

  • DOI
    10.1109/NANO.2007.4601424
  • Filename
    4601424