• DocumentCode
    2608500
  • Title

    Aging Characters Analysis of Composite Insulators

  • Author

    Bo, He ; Jun, CWan ; Haiyun, Jin ; Naikui, Gao ; Zongren, CPeng

  • Author_Institution
    State Key Lab. of Electr. Insulation & Power Equip., Xi´´an JiaoTong Univ., Xianning
  • fYear
    2008
  • fDate
    9-12 Nov. 2008
  • Firstpage
    415
  • Lastpage
    419
  • Abstract
    In this paper, a composite insulator with seven years running history at power grid was taken into account. At first, an electric field was computed through finite elements method and electric field difference at different shed was compared. Secondly, through SEM photos of silastic sections from different sheds, microcosmic structure character of silastic aging under electric and ultraviolet effect was analyzed; through contrasting microcosmic structure of side surface with top and bottom surface of shed, the rules of electric aging and electric erosion was studied; through energy spectrum analysis, the possibility of surface contamination moving into inner of silastic was studied. The results gotten from this paper are positive and helpful for advanced aging studying of composite insulator and optimization design of insulator for anti-aging.
  • Keywords
    ageing; composite insulators; finite element analysis; insulator contamination; insulator testing; power grids; scanning electron microscopy; silicone rubber insulators; spectral analysis; surface contamination; ultraviolet radiation effects; SEM photos; aging characters analysis; composite insulators; electric erosion; electric field difference; energy spectrum analysis; finite element method; insulator design; microcosmic structure; microcosmic structure character; power grid; silastic aging; surface contamination; ultraviolet effect; Aging; Dielectrics and electrical insulation; Electric potential; Finite element methods; History; Insulator testing; Numerical analysis; Power engineering and energy; Power grids; Surface contamination; SEM; Silastic; aging; power spectrum analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Voltage Engineering and Application, 2008. ICHVE 2008. International Conference on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4244-3823-5
  • Electronic_ISBN
    978-1-4244-2810-6
  • Type

    conf

  • DOI
    10.1109/ICHVE.2008.4773961
  • Filename
    4773961