Title :
Low Field Time Dependent Dielectric Integrity
Author :
Anolick, Eugene S. ; Nelson, Glenn R.
Author_Institution :
International Business Machines Corporation, P.O. Box 390, Poughkeepsie, New York 12602
Keywords :
Breakdown voltage; Dielectric devices; Dielectric substrates; FETs; Interference; Statistics; Surfaces; Temperature; Testing; Vehicles;
Conference_Titel :
Reliability Physics Symposium, 1979. 17th Annual
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/IRPS.1979.362864
