• DocumentCode
    2608660
  • Title

    Study on Propagation Characteristics of Electrical Trees in different Electrode System

  • Author

    Jia-bin, Liu ; Quan, Zhou ; Di, Ye ; Tao, Yang ; Rui-jin, Liao ; Shi-Jun, Chen

  • Author_Institution
    State Key Lab. of Power Transm. Equip. & Syst. Security & New Technol., Chongqing Univ., Chongqing
  • fYear
    2008
  • fDate
    9-12 Nov. 2008
  • Firstpage
    445
  • Lastpage
    448
  • Abstract
    The electrical tree discharge channel will be formed at concentrate of electric field in solid insulation dielectric, in order to study the difference of electrical tree under different electrical field, the short-cable electrode system with actual XLPE cable was designed, experiments were performed under 12 kV, 15 kV, 18 kV, 21 kV compare to the needle-plate electrode system. Experiment results show that the electrical tree of short-cable electrode system have the same growth trend with the needle-plate electrode system in the growing characteristic, the dense of electrical tree increase with the addition of voltage level, electrical tree of short-cable electrode system growth slower than the needle-plate electrode system at the same voltage; To get the same shape of electrical tree, the voltage of short-cable electrode system must higher than needle-plate electrode system, the results show that the semiconductor layer and the copper shield layer outside of XLPE cable have very important affection on the electrical trees degradation.
  • Keywords
    XLPE insulation; power cable insulation; trees (electrical); XLPE cable; copper shield layer; electrical tree propagation characteristics; semiconductor layer; short-cable electrode system; solid insulation dielectrics; voltage 12 kV; voltage 15 kV; voltage 18 kV; voltage 21 kV; Cable insulation; Cable shielding; Copper; Degradation; Dielectrics and electrical insulation; Electrodes; Shape; Solids; Trees - insulation; Voltage; Electrical trees; Insulation; Propagation characteristics; XLPE;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Voltage Engineering and Application, 2008. ICHVE 2008. International Conference on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4244-3823-5
  • Electronic_ISBN
    978-1-4244-2810-6
  • Type

    conf

  • DOI
    10.1109/ICHVE.2008.4773969
  • Filename
    4773969