DocumentCode
2608804
Title
Integrated diagnosis-a hierarchical approach
Author
Sheppard, John W. ; Simpson, William R.
Author_Institution
ARINC Res. Corp., Annapolis, MD, USA
fYear
1990
fDate
17-21 Sep 1990
Firstpage
477
Lastpage
483
Abstract
ARINC´s hierarchical model-based approach to integrated maintenance is described. The hierarchical approach is used in the diagnostic aids System Testability and Maintenance Program (STAMP) and Portable Interactive Troubleshooter (POINTER). The information-theoretic approach applied to achieve hierarchical diagnosis is described, and the effectiveness of STAMP and POINTER are described in detail. STAMP and POINTER have the following attributes: the single form of knowledge representation allows all diagnostic elements to function in a consistent manner, regardless of the type or level of maintenance; this knowledge representation can be used for testability analysis, including maintenance architecture and functional packaging; the models are hierarchical, making them easily adaptable to all levels of maintenance; the approach permits diagnosis to be dynamically tailored to the current context; and the models facilitate effective testability assessment, intelligent troubleshooting, and direct links to logistics databases. Thus, STAMP and POINTER, by using the information flow model, permit all aspects of the maintenance process to be addressed using a single method of knowledge representation and a single method of knowledge-base processing
Keywords
automatic test equipment; automatic testing; hierarchical systems; knowledge based systems; knowledge representation; maintenance engineering; military computing; ARINC; POINTER; Portable Interactive Troubleshooter; STAMP; System Testability and Maintenance Program; functional packaging; information flow model; integrated diagnosis; integrated maintenance; intelligent troubleshooting; knowledge representation; knowledge-base processing; logistics databases; maintenance architecture; testability analysis; Automatic test equipment; Automatic testing; Investments; Job shop scheduling; Life testing; Manufacturing; Protocols; Research and development; System testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location
San Antonio, TX
Type
conf
DOI
10.1109/AUTEST.1990.111551
Filename
111551
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