DC testing of analog integrated circuits with piecewise linear approximation and interval analysis

A test method for analog circuits is presented which is based upon simple DC measurements that can be performed directly on the wafer. The authors´ method handles parameters at various levels, e.g., process, device and circuit parameters. In contrast to other methods that use parameter intervals, their method obtains a mathematical relation between the parameters, which results in a more powerful decision criterion. The method may be used as the basis for automatic testing