Wavelet-based adaptive mesh generation for device simulation

In this paper we propose a new method based on wavelet analysis, to define the discretization grid used to solve semiconductor devices PDE systems. We will show that the achieved adaptively refined grid, can be fruitfully used to get a solution with the same level of accuracy of a reference case, which has a considerable larger number of points. The proposed algorithm is given by an automatic procedure that requires neither the user-feedback control nor an in-depth physical knowledge of the problem to be solved, and it is enough accurate to describe all important physical effects encountered in a number of practical situations. 2D practical examples will be discussed (a power p-n junction and a planar MOSFET) to demonstrate (i) how the wavelet-refined grids preserve geometrical and physical consistency, and (ii) the efficiency and reliability of the proposed approach. It seems also useful to notice that, due of its simplicity, the proposed approach can be readily and efficiently extended to perform multidimensional analysis.