• DocumentCode
    2609525
  • Title

    Magnetic Bubble Reliability Testing - Component and System Level Aspects

  • Author

    Davies, John E.

  • Author_Institution
    Intel Magnetics, Inc., 3000 Oakmead Village Dr. Santa Clara, CA 95051, (408) 987-6798
  • fYear
    1980
  • fDate
    29312
  • Firstpage
    83
  • Lastpage
    87
  • Abstract
    Magnetic bubble memory components are extremely attractive for applications requiring high density, non-volatility and solid state reliability. Operating lifetest and accelerated stress test results are presented to classify the component error rates. Built-in error correction at the system level can improve error rates by several orders of magnitude. Calculated and measured error correction data are presented.
  • Keywords
    Error analysis; Life estimation; Life testing; Magnetic domains; Magnetic field measurement; Magnetic fields; Pollution measurement; Solid state circuits; Stress; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1980. 18th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1980.362918
  • Filename
    4208314