DocumentCode
2609525
Title
Magnetic Bubble Reliability Testing - Component and System Level Aspects
Author
Davies, John E.
Author_Institution
Intel Magnetics, Inc., 3000 Oakmead Village Dr. Santa Clara, CA 95051, (408) 987-6798
fYear
1980
fDate
29312
Firstpage
83
Lastpage
87
Abstract
Magnetic bubble memory components are extremely attractive for applications requiring high density, non-volatility and solid state reliability. Operating lifetest and accelerated stress test results are presented to classify the component error rates. Built-in error correction at the system level can improve error rates by several orders of magnitude. Calculated and measured error correction data are presented.
Keywords
Error analysis; Life estimation; Life testing; Magnetic domains; Magnetic field measurement; Magnetic fields; Pollution measurement; Solid state circuits; Stress; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1980. 18th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1980.362918
Filename
4208314
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