• DocumentCode
    2609948
  • Title

    Measuring Pole Tip Recession With Atomic Force Microscope Pitfalls And Solutions

  • Author

    Babcock, K. ; Hopkins, P.

  • Author_Institution
    Digital Instruments, Inc.
  • fYear
    1997
  • fDate
    1-4 April 1997
  • Keywords
    Atomic force microscopy; Atomic measurements; Force measurement; Hysteresis; Instruments; Magnetic force microscopy; Magnetic heads; Magnetoresistance; Phase measurement; Stress measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
  • Conference_Location
    New Orleans, LA, USA
  • Print_ISBN
    0-7803-3862-6
  • Type

    conf

  • DOI
    10.1109/INTMAG.1997.597413
  • Filename
    597413
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2609948