Title :
Error identification and data retrieval in signature analysis based data compaction
Author :
Sun, Xiaoling ; Tutak, Wes
Author_Institution :
Dept. of Electr. Eng., Alberta Univ., Edmonton, Alta., Canada
Abstract :
A novel multiple error identification and data retrieval technique for multiple input shift register (MISR) based signature analysis environment is presented. Utilizing existing BIST resources and using a second MISR, it is capable of identifying any number errors in an input data stream and fully recovering the information lost during signature compaction. The application of this technique in a IC level fault diagnosis scheme is given
Keywords :
automatic testing; built-in self test; data compression; error analysis; error detection; fault diagnosis; integrated circuit testing; logic testing; BIST resources; IC level fault diagnosis scheme; MISR based signature analysis environment; data compaction; data retrieval technique; multiple error identification; multiple input shift register; Application specific integrated circuits; Built-in self-test; Compaction; Data analysis; Fault diagnosis; Feedback; Information retrieval; Polynomials; Shift registers; Testing;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
0-8186-7545-4
DOI :
10.1109/DFTVS.1996.572023
