• DocumentCode
    2610078
  • Title

    Experimental results from IDDF testing

  • Author

    Thibeault, C. ; Payeur, A.

  • Author_Institution
    Dept. de Genie Electr., Ecole de Technologie Superieure, Montreal, Que., Canada
  • fYear
    1996
  • fDate
    6-8 Nov 1996
  • Firstpage
    185
  • Lastpage
    193
  • Abstract
    In this paper, we present experimental results from a test method, called IDDF testing, based on the multiple sampling and processing of the consumption current, IDD. This method can be seen as an extension of IDDQ testing since the IDD frequency spectrum, instead of DC levels, is used to detect defects or faults. The results show that our method is less sensitive to noise than IDDQ testing
  • Keywords
    VLSI; digital integrated circuits; integrated circuit testing; logic testing; signal sampling; IDDF testing; consumption current; multiple sampling; CMOS technology; Electronic equipment testing; Electronics industry; Face detection; Fault detection; Frequency; Logic testing; Microelectronics; Sampling methods; Signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on
  • Conference_Location
    Boston, MA
  • ISSN
    1550-5774
  • Print_ISBN
    0-8186-7545-4
  • Type

    conf

  • DOI
    10.1109/DFTVS.1996.572024
  • Filename
    572024
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2610078