DocumentCode :
2610120
Title :
Corrosion of Aluminum IC Metaillization with Defective Surface Passivation Layer
Author :
Comizzoli, R.B. ; White, L.K. ; Kern, W. ; Schnable, G.L. ; Peters, D.A. ; Tracy, C.E. ; Vibronek, R.D.
Author_Institution :
Solid State Technology Center, RCA Laboratories, Somerville, N.J. 08876.
fYear :
1980
fDate :
29312
Firstpage :
282
Lastpage :
292
Abstract :
Corrosion rates and corrosion current of aluminum line patterns passivated with PSG and silicon nitride were measured. Relationships between corrosion and various parameters including temperature, relative humidity, aluminum deposition method, alloying treatment, passivation layer type and defect density and contaminants are reported. A surface treatment which lowers corrosion currents is also discussed.
Keywords :
Aluminum; Corrosion; Current measurement; Humidity; Passivation; Pollution measurement; Silicon; Surface contamination; Surface treatment; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1980. 18th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1980.362955
Filename :
4208351
Link To Document :
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