Towards built-in-self-test for SNR testing of a mixed-signal IC

Built-in-self-test (BIST) for digital systems has become feasible for a variety of digital VLSI systems. However, mixed analog-digital BIST (MADBIST) has not yet achieved the same degree of practicality. An accurate analog signal source, as well as circuitry to measure the analog response, must be fabricated onto the chip, and must be self-calibrating. A MADBIST is discussed which could be used for a signal-to-noise ratio test on a chip which includes a digital-to-analog converter, an analog-to-digital converter, and a microprocessor which includes RAM and ROM. The MADBIST strategy for the SNR test is introduced, accuracy issues are discussed, and simulation results are presented