Title :
On the performance of augmented signature testing
Author :
Edirisooriya, Geetani ; Edirisooriya, Samantha ; Robinson, John P.
Author_Institution :
Motorola, Tempe, AZ, USA
Abstract :
Signature registers are widely used to compact test Data In Built-in Self-test (BIST) environments. Closed form expressions are obtained for aliasing probability in augmented signature testing which uniquely identifies the quotient, under both generalized independent and q-ary symmetric error models for arbitrary test lengths
Keywords :
automatic testing; built-in self test; fault diagnosis; logic testing; probability; BIST; Built-in Self-test; aliasing probability; augmented signature testing; generalized independent error models; q-ary symmetric error models; quotient; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Computer errors; Electrical fault detection; Equations; Fault detection; Feedback; Registers;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1281-3
DOI :
10.1109/ISCAS.1993.394046
