DocumentCode :
2610233
Title :
Initiability: A Measure Of Sequential Testability
Author :
Hamida, Naim Ben ; Kaminska, Botena ; Savaria, Yvon
Author_Institution :
Ecole Polytech. de Montreal, Que., Canada
fYear :
1993
fDate :
3-6 May 1993
Firstpage :
1619
Abstract :
The testing of sequential circuit is difficult when problems occur concerning setting their initial state and checking their final state after test. The initiability measure is shown to be an efficient means for the quantification of the initialization problem of a sequential circuit. Test point insertion for sequential circuits based on the proposed modeling technique and the initiability concept is discussed. The technique for selecting the appropriate flip-flops for inclusion into partial scan is described. For all experiments, the initiability analysis is performed by the tool for sequential testability analysis (TOSTA)
Keywords :
boundary scan testing; flip-flops; logic partitioning; logic testing; sequential circuits; Sequential Testability; final state; flip-flops; initiability measure; initial state; modeling technique; sequential circuit; sequential testability analysis; test point insertion; Circuit faults; Circuit testing; Combinational circuits; Controllability; Flip-flops; Logic testing; Observability; Sequential analysis; Sequential circuits; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1281-3
Type :
conf
DOI :
10.1109/ISCAS.1993.394049
Filename :
394049
Link To Document :
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