• DocumentCode
    2610233
  • Title

    Initiability: A Measure Of Sequential Testability

  • Author

    Hamida, Naim Ben ; Kaminska, Botena ; Savaria, Yvon

  • Author_Institution
    Ecole Polytech. de Montreal, Que., Canada
  • fYear
    1993
  • fDate
    3-6 May 1993
  • Firstpage
    1619
  • Abstract
    The testing of sequential circuit is difficult when problems occur concerning setting their initial state and checking their final state after test. The initiability measure is shown to be an efficient means for the quantification of the initialization problem of a sequential circuit. Test point insertion for sequential circuits based on the proposed modeling technique and the initiability concept is discussed. The technique for selecting the appropriate flip-flops for inclusion into partial scan is described. For all experiments, the initiability analysis is performed by the tool for sequential testability analysis (TOSTA)
  • Keywords
    boundary scan testing; flip-flops; logic partitioning; logic testing; sequential circuits; Sequential Testability; final state; flip-flops; initiability measure; initial state; modeling technique; sequential circuit; sequential testability analysis; test point insertion; Circuit faults; Circuit testing; Combinational circuits; Controllability; Flip-flops; Logic testing; Observability; Sequential analysis; Sequential circuits; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-1281-3
  • Type

    conf

  • DOI
    10.1109/ISCAS.1993.394049
  • Filename
    394049