DocumentCode
2610303
Title
Application of Step Stress to Time Dependent Breakdown
Author
Anolick, Eugene S. ; Chen, Li-Yu
Author_Institution
International Business Machines Corporation, F74/052, P.O. Box 390, Poughkeepsie, N.Y. 12602. 914-463-8705
fYear
1981
fDate
29677
Firstpage
23
Lastpage
27
Abstract
A method of speeding up testing by step stressing is described. The mathematic models utilized, the theoretical and experimental results, and application to final failure rate estimates are shown.
Keywords
Breakdown voltage; Dielectric breakdown; Dielectric devices; Electric breakdown; History; Mathematical model; Mathematics; Stress control; Temperature; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1981. 19th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1981.362967
Filename
4208366
Link To Document