DocumentCode
2610394
Title
Humidity Activated Surface Leakage Paths on T.O. Case Style Glass Headers
Author
Calderbank, James M. ; Holloway, Paul
Author_Institution
E-Systems, ECI Division, 1501 72nd Street North, P.O. Box 12248, St. Petersburg, FL 33733. (813) 381-2000
fYear
1981
fDate
29677
Firstpage
56
Lastpage
59
Abstract
This paper reviews the analysis of exterior leakage paths causing failures of common 2N2222A transistors. The failure mechanism, exterior leakage paths activated in high humidity conditions on the surface of glass seals, is identified. The glass constituents which are responsible for this intermittent, sometime self-correcting failure mechanism are discussed and the method of conduction analyzed.
Keywords
Chromium; Failure analysis; Glass; History; Humidity; Iron; Seals; Temperature; Testing; Zinc;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1981. 19th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1981.362974
Filename
4208373
Link To Document