Title :
Dynamic Measurement of the Water Vapor Content of Integrated Circuit Packages using Derivative Infrared Diode Laser Spectroscopy
Author :
Bossard, P.R. ; Mucha, J.A.
Author_Institution :
Bell Laboratories, Murray Hill, New Jersey 07974
Keywords :
Absorption; Diode lasers; Frequency; Infrared spectra; Integrated circuit measurements; Integrated circuit packaging; Laser beams; Moisture measurement; Spectroscopy; Testing;
Conference_Titel :
Reliability Physics Symposium, 1981. 19th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1981.362975