Title :
The use of Marginal Voltage Measurements to Detect and Locate Defects in Digital Microcircuits
Author :
Ager, D J ; Henderson, J C
Author_Institution :
British Telecom Research Laboratories, Martlesham Heath, Ipswich IP5 7RE England
Abstract :
By combining a measurement of the supply voltages below which a digital integrated circuit misoperates during a functional test, and a lightspot scanning technique, it is shown how defects can be both detected and located in circuits which otherwise appear normal. Equipment is described and examples are given of defects found.
Keywords :
Circuit testing; Current supplies; Digital integrated circuits; Integrated circuit manufacture; Integrated circuit measurements; Integrated circuit testing; Logic circuits; Logic testing; System testing; Voltage measurement;
Conference_Titel :
Reliability Physics Symposium, 1981. 19th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1981.362986
