DocumentCode
2610571
Title
The use of Marginal Voltage Measurements to Detect and Locate Defects in Digital Microcircuits
Author
Ager, D J ; Henderson, J C
Author_Institution
British Telecom Research Laboratories, Martlesham Heath, Ipswich IP5 7RE England
fYear
1981
fDate
29677
Firstpage
139
Lastpage
148
Abstract
By combining a measurement of the supply voltages below which a digital integrated circuit misoperates during a functional test, and a lightspot scanning technique, it is shown how defects can be both detected and located in circuits which otherwise appear normal. Equipment is described and examples are given of defects found.
Keywords
Circuit testing; Current supplies; Digital integrated circuits; Integrated circuit manufacture; Integrated circuit measurements; Integrated circuit testing; Logic circuits; Logic testing; System testing; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1981. 19th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1981.362986
Filename
4208385
Link To Document