• DocumentCode
    2610583
  • Title

    Robust Alignment of Transmission Electron Microscope Tilt Series

  • Author

    Brandt, Sami S. ; Ziese, Ulrike

  • Author_Institution
    Lab. of Comput. Eng., Helsinki Univ. of Technol.
  • Volume
    4
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    683
  • Lastpage
    686
  • Abstract
    In this paper, we propose a novel method for automatic, feature-based alignment of transmission electron microscope images that is needed for computing 3D reconstructions in electron tomography. The proposed method, termed as trifocal alignment, is more accurate than the previous markerless methods. The key components of this work are: (1) a reliable multiresolution algorithm for matching feature points between images, (2) a robust, maximum-likelihood-based estimator for determining the trifocal constraint, needed for validating the correctness of the matches, (3) a robust, large scale optimisation framework to compute the alignment parameters from hundreds of thousands of feature point measurements from a couple of hundred images. The experiments show for the first time that by the proposed feature-based alignment approach the accuracy level of the fiducial marker alignment can be achieved
  • Keywords
    feature extraction; image reconstruction; image registration; maximum likelihood estimation; stereo image processing; transmission electron microscopy; 3D reconstructions; electron tomography; feature point matching; feature-based alignment; fiducial marker alignment; image alignment; maximum-likelihood-based estimator; multiresolution algorithm; transmission electron microscope images; transmission electron microscope tilt series alignment; trifocal alignment; Chemical technology; Chemistry; Constraint optimization; Image reconstruction; Image resolution; Laboratories; Large-scale systems; Robustness; Tomography; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-2521-0
  • Type

    conf

  • DOI
    10.1109/ICPR.2006.1000
  • Filename
    1699933