• DocumentCode
    2610635
  • Title

    Functional verification of ECL circuits including voltage regulators

  • Author

    Brauer, E.J. ; Kang, S.M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • fYear
    1993
  • fDate
    3-6 May 1993
  • Firstpage
    1710
  • Abstract
    Three major steps in designing emitter-coupled logic (ECL) circuits are generating correct functional behavior, guaranteeing design rules are obeyed, and verifying delay behavior. Previous ECL simulators have not addressed the checking of design rules, and have not included voltage regulators. In the authors´ functional verifier, the circuit partitioning module divides the circuit into current source trees and identifies voltage regulators. The reference voltages generated by the voltage regulators are calculated using electrical simulation techniques, and a simplified Ebers-Moll transistor model is used to calculate current sharing in emitter-coupled transistors of the switching subcircuits. The functional verification approach introduced can be used to verify circuit functionality under varying operating conditions of power supply voltage, temperature and device parameters, and, in addition, to detect design errors such as deep transistor saturation, excessive emitter current and voltage margin violations. For an industrial benchmark circuit with 842 transistors, the authors´ functional verifier performs the functional simulation and detects design errors over 800 times faster than the DC and transient analysis of simulation program with IC emphasis (SPICE)3
  • Keywords
    delays; digital simulation; emitter-coupled logic; logic CAD; logic partitioning; voltage regulators; ECL circuits; Ebers-Moll transistor model; circuit functionality; circuit partitioning module; current sharing; current source trees; deep transistor saturation; delay behavior; design rules; electrical simulation techniques; emitter current; emitter-coupled logic; functional behavior; industrial benchmark circuit; power supply voltage; voltage margin violations; voltage regulators; Analytical models; Circuit simulation; Delay; Electricity supply industry; Logic circuits; Logic design; Power supplies; Regulators; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-1281-3
  • Type

    conf

  • DOI
    10.1109/ISCAS.1993.394072
  • Filename
    394072