DocumentCode :
2610729
Title :
Texture: a ray tracing program for the photovoltaic community
Author :
Smith, A. ; Rohatgi, A. ; Neel, S.
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1990
fDate :
21-25 May 1990
Firstpage :
426
Abstract :
Increased interest in light-trapping techniques to enhance the output current of silicon solar cells has led to a variety of surface texturing designs. Unfortunately, the inability to quantify and eliminate some of the photon loss mechanisms have not allowed textured cells to reach their full potential. Texture, a Monte Carlo ray-tracing program which is capable of addressing the above issues, has been written. The program has a convenient user interface and a variety of output modes. Different material systems, such as GaAs, InP, and thin films on textured glass, can also be modeled by Texture. It is shown that the output of the Texture program compares quite favorably with results of other researchers under the same assumptions. The program also provides additional quantitative information about photon losses due to the sides of the cell, grid absorption, and imperfect back-surface reflectance. Output results show that tetrahedrons are more effective light-trapping structures than tilted pyramids (40.87 mA compared to 40.37 mA)
Keywords :
Monte Carlo methods; computational geometry; computer graphics; geometrical optics; solar cells; GaAs solar cells; InP solar cells; Monte Carlo ray-tracing program; Si solar cells; Texture program; grid absorption; imperfect back-surface reflectance; light-trapping techniques; output current; photon loss mechanisms; surface texturing designs; tetrahedrons; Gallium arsenide; Indium phosphide; Monte Carlo methods; Photovoltaic cells; Photovoltaic systems; Ray tracing; Silicon; Solar power generation; Surface texture; User interfaces;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1990., Conference Record of the Twenty First IEEE
Conference_Location :
Kissimmee, FL
Type :
conf
DOI :
10.1109/PVSC.1990.111660
Filename :
111660
Link To Document :
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