Title :
Effects of perimeter recombination on GaAs-based solar cells
Author :
Stellwag, T. ; Dodd, P. ; Carpenter, M. ; Lundstrom, M. ; Pierret, R. ; Melloch, M. ; Yablonovitch, F. ; Gmitter, T.
Author_Institution :
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
Perimeter recombination currents have been experimentally characterized on GaAs p/n heteroface diodes and solar cells with areas ranging from 2.5×10-5 to 0.25 cm2. Under 1-sun operation at the maximum power point, measurements show that the n≈2 perimeter recombination current component degrades the cell´s fill factors but does not greatly affect the open-circuit voltage. The n≈2 perimeter recombination currents are examined theoretically on small-area cells using a two-dimensional drift-diffusion device simulator, PUPHS2D. This model verifies the importance and origin of perimeter recombination in heteroface GaAs-based solar cells. Two methods of reducing the n≈2 perimeter recombination are explored
Keywords :
III-V semiconductors; electron-hole recombination; gallium arsenide; solar cells; 1-sun operation; 2D drift-diffusion device simulator; GaAs solar cells; PUPHS2D; fill factors; heteroface; open-circuit voltage; perimeter recombination currents; semiconductor; Current measurement; Dark current; Degradation; Diodes; Gallium arsenide; Molecular beam epitaxial growth; Optical films; Photovoltaic cells; Substrates; Temperature;
Conference_Titel :
Photovoltaic Specialists Conference, 1990., Conference Record of the Twenty First IEEE
Conference_Location :
Kissimmee, FL
DOI :
10.1109/PVSC.1990.111663