Title :
Fractal analysis of bidimensional profiles and application to electromagnetic scattering from soils
Author :
Rouvier, S. ; Borderies, P. ; Chênerie, I. ; Souyris, J.C. ; Le Toan, Thuy ; Floury, N.
Author_Institution :
ONERA-CERT, Toulouse, France
Abstract :
This communication addresses relevancy of fractals as descriptors of bare soils and fractal dimension of the ultra wide band scattered field as a discriminating feature for them. The box counting method is described and applied to numerically generated profiles, experimental soil profiles and simulated scattered fields. The experimental soil profiles are found to exhibit a fractal behavior. It is shown that a monotonous relation links profile and scattered field fractal dimensions
Keywords :
backscatter; fractals; geophysical techniques; radar cross-sections; radar theory; remote sensing by radar; soil; backscatter; bidimensional profile; box counting method; electromagnetic scattering; fractal analysis; fractal dimension; fractals; geophysical measurement technique; land surface; radar remote sensing; radar scattering; soil; terrain mapping; ultra wide band scattered field; Data mining; Electromagnetic analysis; Electromagnetic scattering; Fractals; Geometry; Radar scattering; Rough surfaces; Soil; Surface roughness; Ultra wideband radar;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1996. IGARSS '96. 'Remote Sensing for a Sustainable Future.', International
Conference_Location :
Lincoln, NE
Print_ISBN :
0-7803-3068-4
DOI :
10.1109/IGARSS.1996.516924
