Title :
Determining Critical Loads For Ultra-Thin Overcoats Using A Depth Sensing Nanoindentation Multiple Sliding Technioue
Author :
Hong Deng ; Scharf, T.W. ; Barnard, J.A.
Author_Institution :
The University of Alabama
Keywords :
Friction; Information technology; Inorganic materials; Magnetic materials; Magnetic properties; Mechanical factors; Protection; Semiconductor films; Silicon carbide; System testing;
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
DOI :
10.1109/INTMAG.1997.597417
