DocumentCode

2610995

Title

Lifetime acceleration model for HAST tests of a pHEMT process

Author

Ersland, Peter ; Jen, Hei-Ruey ; Yang, Xinxing

fYear

2003

fDate

2003

Firstpage

3

Lastpage

6

Keywords

Humidity; Life estimation; Life testing; PHEMTs; Plastics; Qualifications; Semiconductor device packaging; Stress; Switches; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

GaAs Reliability Workshop, 2003. Proceedings

Print_ISBN

0-7908-0104-3

Type

conf

DOI

10.1109/GAASRW.2003.183764

Filename

1397315