Title :
Off-state PHEMT breakdown: a temperature-dependent analysis
Author :
Cova, P. ; Gallinari, D. ; Delmonte, N. ; Alessi, R. ; Menozzi, R.
Keywords :
Electric breakdown; Gallium arsenide; Iron; Measurement standards; PHEMTs; Semiconductor diodes; Solid state circuits; Temperature; Tunneling; Voltage;
Conference_Titel :
GaAs Reliability Workshop, 2003. Proceedings
Print_ISBN :
0-7908-0104-3
DOI :
10.1109/GAASRW.2003.183766
