Reliability-directed distributed computer-aided design system

Author

Abramov, O.V. ; Katueva, Y.V. ; Nazarov, D.A.

Author_Institution

Far Eastern Branch of Russian Acad. of Sci., Vladivostok

fYear

2007

fDate

2-4 Dec. 2007

Firstpage

1171

Lastpage

1175

Abstract

A theoretical approach and applied techniques for designing analogous electronic devices and systems with due account of random variations in system parameters and reliability specifications are considered. The paper discusses the problem of choosing parameter nominals of electronic devices and systems for which the system survival probability or the performance assurance probability for the predetermined time period is maximized. Several algorithms for region of acceptability location, modeling and discrete optimization using parallel and distributed processing are discussed. For seeking a numerical solution of the parametric design problem a distributed computer-aided reliability-oriented design system is proposed.

Keywords

electronic design automation; reliability; acceptability location; analogous electronic devices; discrete optimization; reliability-directed distributed computer-aided design system; system survival probability; Algorithm design and analysis; Automatic control; Cost function; Degradation; Design automation; Distributed computing; Distributed processing; Reliability theory; Stochastic processes; Systems engineering and theory; Parameter optimization; distributed computer-aided design system; parallel algorithm; reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Engineering and Engineering Management, 2007 IEEE International Conference on

Conference_Location

Singapore

Print_ISBN

978-1-4244-1529-8

Electronic_ISBN

978-1-4244-1529-8

Type

conf

DOI

10.1109/IEEM.2007.4419376

Filename

4419376