Title :
High-resolution transmission electron microscopy on aged inp HBTs
Author :
Perham, Timothy J. ; Paine, Bruce M. ; Thomas, Stephen, III
Keywords :
Aging; Contacts; Degradation; Focusing; Gold; Heterojunction bipolar transistors; Indium phosphide; Inspection; Scanning electron microscopy; Transmission electron microscopy;
Conference_Titel :
GaAs Reliability Workshop, 2003. Proceedings
Print_ISBN :
0-7908-0104-3
DOI :
10.1109/GAASRW.2003.183769
