DocumentCode
2611095
Title
High-resolution transmission electron microscopy on aged inp HBTs
Author
Perham, Timothy J. ; Paine, Bruce M. ; Thomas, Stephen, III
fYear
2003
fDate
2003
Firstpage
83
Lastpage
105
Keywords
Aging; Contacts; Degradation; Focusing; Gold; Heterojunction bipolar transistors; Indium phosphide; Inspection; Scanning electron microscopy; Transmission electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
GaAs Reliability Workshop, 2003. Proceedings
Print_ISBN
0-7908-0104-3
Type
conf
DOI
10.1109/GAASRW.2003.183769
Filename
1397323
Link To Document