DocumentCode
2611277
Title
Soft Error Studies using a Scanning Source
Author
Henley, F.J. ; Oldham, W.G.
Author_Institution
Department of Electrical Engineering and Computer Sciences and the Electronics Research Laboratory, University of California, Berkeley, CA 94720
fYear
1982
fDate
30011
Firstpage
88
Lastpage
91
Abstract
A system was developed to investigate the alpha particle noise burst susceptibility of individual circuit nodes. The data are generated by scanning the circuit with both a focused laser spot and a micro-capillary collimated alpha particle beam. The laser is used in a rapid scan, coarse raster, to identify sensitive nodes. The collimated alpha source is used to investigate the soft error susceptibility in the vicinity of these nodes. Correlation between maps using both laser and alpha sources is generally good. Sensitivity maps of both special test structures and commercial dynamic RAMs are given as examples of the technique.
Keywords
Alpha particles; Circuits; Collimators; Computer errors; Error correction; Laser beams; Laser noise; Particle beams; Power lasers; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1982. 20th Annual
Conference_Location
San Diego, NV, USa
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1982.363027
Filename
4208429
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