• DocumentCode
    2611316
  • Title

    Session 12-B process: Interfaces & electromigration

  • fYear
    2010
  • fDate
    6-8 Sept. 2010
  • Firstpage
    211
  • Lastpage
    212
  • Abstract
    Start of the above-titled section of the conference proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices (SISPAD), 2010 International Conference on
  • Conference_Location
    Bologna
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-4244-7701-2
  • Type

    conf

  • DOI
    10.1109/SISPAD.2010.5604525
  • Filename
    5604525
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2611316