DocumentCode
2611342
Title
Reconfiguration of 1½ track-switch mesh-arrays with PE and bus faults
Author
Horita, Tadayoshi ; Takanami, Itsuo
Author_Institution
Dept. of Comput. & Inf. Sci., Iwate Univ., Morioka, Japan
fYear
1996
fDate
6-8 Nov 1996
Firstpage
335
Lastpage
339
Abstract
The mesh-connected processor array model using 1½ track-switches has an advantage of its inherent simplicity of the routing hardware. In this paper, for the model, we investigate its fault tolerant ability for simultaneous processor element (PE) and bus faults. First, we discuss how interconnections are restructured, avoiding faulty PE and buses. Then, we present a neural algorithm for reconfiguration, using a Hopfield-type neural network model. We show the influence of bus faults on the reliabilities of arrays by simulation. The proposed neural algorithm has an advantage that the computation time for reconstruction is so small. Furthermore, the algorithm has a potentiality that a built-in self-reconfigurable system may be realized by implementing the algorithm by hardware in a less complicated way
Keywords
Hopfield neural nets; VLSI; computational complexity; fault tolerant computing; network routing; parallel architectures; reconfigurable architectures; Hopfield-type neural network model; built-in self-reconfigurable system; bus faults; neural algorithm; processor element faults; reconstruction computation time; routing hardware; track-switch mesh-arrays; Computational modeling; Electronic mail; Fault tolerance; Fault tolerant systems; Hardware; Hopfield neural networks; Information science; Neural networks; Routing; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on
Conference_Location
Boston, MA
ISSN
1550-5774
Print_ISBN
0-8186-7545-4
Type
conf
DOI
10.1109/DFTVS.1996.572041
Filename
572041
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