DocumentCode
2611607
Title
Influence of Oxide Characteristics on the Reliability of Bipolar Products
Author
Tremintin, B.
Author_Institution
IBM - FRANCE, Matra Harris Semiconducteur, B.P. 942, 44075 NANTES CEDEX - France tel.(40)49.08.20
fYear
1982
fDate
30011
Firstpage
224
Lastpage
227
Keywords
Charge measurement; Current measurement; Density measurement; Electric variables measurement; Electronic equipment testing; Equations; FETs; Interface states; Telephony; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1982. 20th Annual
Conference_Location
San Diego, NV, USa
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1982.361932
Filename
4208450
Link To Document