DocumentCode :
2611697
Title :
Comparisons of the symmetric and asymmetric control limits for [X] charts
Author :
Chen, Huifen ; Kuo, Wei-Lun
Author_Institution :
Chung-Yuan Univ., Chung Li
fYear :
2007
fDate :
2-4 Dec. 2007
Firstpage :
1379
Lastpage :
1383
Abstract :
This work compares the X macr chart performance for the symmetric and asymmetric limits. The Shewhart X macr control chart is useful in detecting a shift in the process mean. A conventional way of setting the control limits is using a set of symmetric limits, e.g., the 3-sigma limits. Despite literature of constructing asymmetric control limits for skewed distributions exists, none has compared these two kinds of limits on an equal basis. We compare the out-of-control ARL (average run length) for symmetric and asymmetric limits while keeping their in-control ARL values the same. Two testing examples are used: gamma and Johnson unbounded distributions. Our empirical study shows that if the quality characteristic has a right skewed distribution, the symmetric limits perform better than the asymmetric limits when the process mean shifts to a larger value and worse otherwise. Analogously, if the skewness is negative, the symmetric limits perform better than the asymmetric limits when the mean shifts to a smaller value and worse otherwise. None fully dominates the other. Therefore, even when the quality characteristic has a skewed distribution, the choice of symmetric or asymmetric limits depends on the directions of the shift and skewness.
Keywords :
control charts; gamma distribution; 3-sigma limits; Johnson unbounded distributions; Shewhart X macr control chart; asymmetric control limits; average run length; gamma unbounded distributions; Control charts; Distributed computing; Distribution functions; Industrial engineering; Length measurement; Monitoring; Process control; Size control; Testing; Weibull distribution; $bar X$ chart; Asymmetric control limits; SPC; average run length; shift; skewed distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management, 2007 IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1529-8
Electronic_ISBN :
978-1-4244-1529-8
Type :
conf
DOI :
10.1109/IEEM.2007.4419418
Filename :
4419418
Link To Document :
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