DocumentCode
2611780
Title
Design of Predistorter Using Measured Nonlinear Characteristics of Power Amplifier with Memory Effect
Author
Oishi, Yasuyuki ; Kimura, Shigekazu ; Takago, Daisuke ; Daido, Yoshimasa ; Araki, Kiyomichi ; Fukuda, Eisuke ; Takano, Takeshi
Author_Institution
Network Syst. Labs., Fujitsu Labs. Ltd., Atsugi, Japan
fYear
2012
fDate
6-9 May 2012
Firstpage
1
Lastpage
5
Abstract
This paper describes a method to design a predistorter (PD) for a power amplifier (PA) with a memory effect by using nonlinear parameters extracted from measured intermodulation distortion (IMD) for a GaN-FET amplifier. To improve the computational efficiency, the updating of a cancellation signal is provided by an iterative algorithm. It is confirmed that the proposed algorithm attains computational intensity lower than half of a memory polynomial. A computer simulation has clarified that the PD improves the adjacent channel leakage power ratio (ACLR) of OFDM signals with several hundred subcarriers corresponding to 4G mobile radio communications. It has been confirmed that a fifth-order PD is effective up to a higher power level. The improvement of error vector magnitude (EVM) by the PD is also simulated for OFDM signals of which the subcarrier channels are modulated by 16 QAM.
Keywords
4G mobile communication; III-V semiconductors; field effect transistors; gallium compounds; polynomials; power amplifiers; quadrature amplitude modulation; 4G mobile radio communication; GaN; GaN-FET amplifier; OFDM signal; QAM; adjacent channel leakage power ratio; cancellation signal updating; computational efficiency; computer simulation; error vector magnitude; fifth-order PD; intermodulation distortion; iterative algorithm; memory effect; memory polynomial; nonlinear characteristics measurement; nonlinear parameter extraction; power amplifier; predistorter design; Memory management; Nonlinear distortion; OFDM; Phase measurement; Polynomials; Power amplifiers; RLC circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Vehicular Technology Conference (VTC Spring), 2012 IEEE 75th
Conference_Location
Yokohama
ISSN
1550-2252
Print_ISBN
978-1-4673-0989-9
Electronic_ISBN
1550-2252
Type
conf
DOI
10.1109/VETECS.2012.6240090
Filename
6240090
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