DocumentCode

2611805

Title

Workshop Report EOS/ESD Damage Failure Trait Photograph Interpretation

Author

Walker, Roy C.

Author_Institution

SAR Associates, RR 2 Box 500, Rome, NY 13440, (315 )339-3968

fYear

1982

fDate

30011

Firstpage

278

Lastpage

283

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1982. 20th Annual

Conference_Location

San Diego, NV, USa

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1982.361944

Filename

4208462