DocumentCode

2611821

Title

Thin Film Electromigration Workshop

fYear

1982

fDate

30011

Firstpage

284

Lastpage

284

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1982. 20th Annual

Conference_Location

San Diego, NV, USa

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1982.361945

Filename

4208463