DocumentCode :
2611837
Title :
Assurance Procedures for the Control of Electromigration
Author :
Bart, John J. ; Walter, Martin
Author_Institution :
Reliability and Compatibility Division, Rome Air Development Center, Griffiss AFB NY
fYear :
1982
fDate :
30011
Firstpage :
285
Lastpage :
287
Keywords :
Aluminum; Conducting materials; Conductive films; Conductors; Current density; Electromigration; Failure analysis; Metallization; Microstructure; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1982. 20th Annual
Conference_Location :
San Diego, NV, USa
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1982.361946
Filename :
4208464
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2611837
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