• DocumentCode
    2612004
  • Title

    Feasibility study for photon counting detector for high resolution pre clinical SPECT

  • Author

    Tibbelin, Sandra ; Badano, Aldo ; Danielsson, Mats

  • Author_Institution
    Department of Physics, The Royal Institute of Technology, Stockholm, Sweden
  • fYear
    2008
  • fDate
    19-25 Oct. 2008
  • Firstpage
    3975
  • Lastpage
    3979
  • Abstract
    We plan to integrate a photon counting, large area, high spatial resolution, high efficiency detector in a system for pre-clinical SPECT. We are aiming for a high spatial resolution for the detector of around 20 μm. The agent for radiolabelling is assumed to be 125I, with an emission peak at 27 keV, since it is readily available. The aim of this feasibility study was to optimize the scintillator and electronics. We consider a complementary metal-oxide-semiconductor (CMOS) circuit together with a columnar CsI scintillator. In our case CMOS is advantageous over CCD due to a more flexible readout and an opportunity for data processing and trigger logic at the pixel level. The position of the x-ray interaction in the scintillator can be estimated with high accuracy by fitting a two-dimensional Gaussian curve to the pixel hit-map. The goal of this study is to determine optimal scintillator thickness, pixel size, readout rate and the corresponding achievable spatial resolution. Results for a CsI thickness of 600 μm show a detection efficiency close to 90 % and a spatial resolution in the range of 20 μm. Optimum pixel size for this application is between 40 – 60 μm and as long as the readout speed exceeds 750 Hz the noise from the dark current will not be significant.
  • Keywords
    Charge coupled devices; Circuits; Optical imaging; Optoelectronic and photonic sensors; Physics; Single photon emission computed tomography; Spatial resolution; X-ray detection; X-ray detectors; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
  • Conference_Location
    Dresden, Germany
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-2714-7
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2008.4774154
  • Filename
    4774154