DocumentCode :
2612029
Title :
Deposition of CuInSe2 by the hybrid sputtering and evaporation method
Author :
Rockett, A. ; Agarwal, A. ; Yang, L. ; Banda, E. ; Kenshole, G. ; Kiely, C. ; Talieh, H.
Author_Institution :
Illinois Univ., Urbana, IL, USA
fYear :
1990
fDate :
21-25 May 1990
Firstpage :
764
Abstract :
CuInSe2 thin films deposited by a hybrid process combining magnetron sputtering of Cu and In with evaporation of Se have been analyzed and solar cells have been fabricated. The hybrid technique is shown to produce CuInSe2 films of device quality. Heterojunction Mo/CuInSe2/CdS/ITO/Ni devices with photovoltaic conversion efficiencies as high as 7.7% have been tested. Device characteristics for the best device include Voc =0.385 V, Jsc=32.6 mA, and a fill factor of 61.3%. The device required an air anneal to achieve full efficiency. Results of microstructural analyses using transmission electron microscopy are reported. The results assist in determining what limits the performance of these devices. As-deposited CuInSe2 exhibits no measurable differences as compared with CuInSe2 produced by three-source evaporation. All films contain microtwins, stacking faults, and voids. No evidence was found for second phases in material with metal atom fractions as much as 4% off stoichiometry. Defect ordering produces features in the diffraction patterns of single-phase material at positions not normally allowed for the chalcopyrite structure. These measurements are compared with results for single crystals grown with the vertical Bridgeman method by Tomlinson (1986). X-ray photoelectron spectroscopy results characterizing the valence band as a function of film composition are also presented
Keywords :
X-ray photoelectron spectra; copper compounds; crystal defects; evaporation; indium compounds; semiconductor device manufacture; solar cells; sputtered coatings; sputtering; ternary semiconductors; transmission electron microscope examination of materials; valence bands; 0.385 V; 32.6 mA; 7.7 percent; CuInSe2; X-ray photoelectron spectroscopy; chalcopyrite structure; diffraction patterns; evaporation; fill factor; heterojunctions; magnetron; microstructural analyses; microtwins; performance; quality; semiconductors; solar cells; sputtering; stacking faults; transmission electron microscopy; valence band; vertical Bridgeman method; voids; Annealing; Crystalline materials; Heterojunctions; Indium tin oxide; Magnetic analysis; Photovoltaic cells; Photovoltaic systems; Solar power generation; Sputtering; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1990., Conference Record of the Twenty First IEEE
Conference_Location :
Kissimmee, FL
Type :
conf
DOI :
10.1109/PVSC.1990.111723
Filename :
111723
Link To Document :
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