• DocumentCode
    2612029
  • Title

    Deposition of CuInSe2 by the hybrid sputtering and evaporation method

  • Author

    Rockett, A. ; Agarwal, A. ; Yang, L. ; Banda, E. ; Kenshole, G. ; Kiely, C. ; Talieh, H.

  • Author_Institution
    Illinois Univ., Urbana, IL, USA
  • fYear
    1990
  • fDate
    21-25 May 1990
  • Firstpage
    764
  • Abstract
    CuInSe2 thin films deposited by a hybrid process combining magnetron sputtering of Cu and In with evaporation of Se have been analyzed and solar cells have been fabricated. The hybrid technique is shown to produce CuInSe2 films of device quality. Heterojunction Mo/CuInSe2/CdS/ITO/Ni devices with photovoltaic conversion efficiencies as high as 7.7% have been tested. Device characteristics for the best device include Voc =0.385 V, Jsc=32.6 mA, and a fill factor of 61.3%. The device required an air anneal to achieve full efficiency. Results of microstructural analyses using transmission electron microscopy are reported. The results assist in determining what limits the performance of these devices. As-deposited CuInSe2 exhibits no measurable differences as compared with CuInSe2 produced by three-source evaporation. All films contain microtwins, stacking faults, and voids. No evidence was found for second phases in material with metal atom fractions as much as 4% off stoichiometry. Defect ordering produces features in the diffraction patterns of single-phase material at positions not normally allowed for the chalcopyrite structure. These measurements are compared with results for single crystals grown with the vertical Bridgeman method by Tomlinson (1986). X-ray photoelectron spectroscopy results characterizing the valence band as a function of film composition are also presented
  • Keywords
    X-ray photoelectron spectra; copper compounds; crystal defects; evaporation; indium compounds; semiconductor device manufacture; solar cells; sputtered coatings; sputtering; ternary semiconductors; transmission electron microscope examination of materials; valence bands; 0.385 V; 32.6 mA; 7.7 percent; CuInSe2; X-ray photoelectron spectroscopy; chalcopyrite structure; diffraction patterns; evaporation; fill factor; heterojunctions; magnetron; microstructural analyses; microtwins; performance; quality; semiconductors; solar cells; sputtering; stacking faults; transmission electron microscopy; valence band; vertical Bridgeman method; voids; Annealing; Crystalline materials; Heterojunctions; Indium tin oxide; Magnetic analysis; Photovoltaic cells; Photovoltaic systems; Solar power generation; Sputtering; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1990., Conference Record of the Twenty First IEEE
  • Conference_Location
    Kissimmee, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.1990.111723
  • Filename
    111723