Title :
High quality GaAs/InGaAs/AlGaAs vertical-cavity surface-emitting lasers grown at a constant temperature by molecular beam epitaxy
Author :
Zhang, D.H. ; Li, C.Y.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
Abstract :
Low threshold current GaAs/InGaAs vertical cavity surface emitting lasers could be successfully grown by molecular beam epitaxy at a fixed substrate temperature of 560°C which is compromised for InGaAs and AlGaAs materials, The thickness of each pair of layers in the device structures could be easily controlled using an infrared pyrometer system. Lasers with a three quantum well active region grown under such conditions show a threshold current density of 310 A cm-2 and a maximum output power of 0.8 mW from a 15×15 μm2 device at room temperature continuous wave operation
Keywords :
current density; laser cavity resonators; molecular beam epitaxial growth; pyrometers; quantum well lasers; semiconductor growth; surface emitting lasers; thickness control; 0.8 mW; 15 mum; 560 degC; GaAs-InGaAs-AlGaAs; constant temperature; fixed substrate temperature; high quality GaAs/InGaAs/AlGaAs VCSEL; infrared pyrometer system; low threshold current; molecular beam epitaxy; output power; room temperature continuous wave operation; thickness control; three quantum well active region; threshold current density; vertical-cavity surface-emitting lasers; Gallium arsenide; Indium gallium arsenide; Molecular beam epitaxial growth; Optical control; Optical materials; Quantum well lasers; Substrates; Surface emitting lasers; Threshold current; Vertical cavity surface emitting lasers;
Conference_Titel :
Optoelectronic and Microelectronic Materials And Devices Proceedings, 1996 Conference on
Conference_Location :
Canberra, ACT
Print_ISBN :
0-7803-3374-8
DOI :
10.1109/COMMAD.1996.610068