Title :
Uncertainty and sensitivity analysis in high speed device modeling
Author :
Vai, Man-Kuan ; Chen, Ying ; Prasad, Sheila ; Meskoob, Bahman ; Bulutay, Ceyhun
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Abstract :
The simulated annealing (SA) algorithm is extended to extract uncertainty and sensitivity information from the equivalent circuit modeling process. This information is obtained from the probabilistic space exploration process applied in SA. The results obtained from modeling a novel collector-up heterojunction bipolar transistor (HBT) are presented
Keywords :
equivalent circuits; heterojunction bipolar transistors; semiconductor device models; sensitivity analysis; simulated annealing; HBT; collector-up; equivalent circuit modeling; heterojunction bipolar transistor; high speed device modeling; probabilistic space exploration process; sensitivity analysis; simulated annealing; uncertainty information; Circuit simulation; Cost function; Data mining; Equivalent circuits; Heterojunction bipolar transistors; Optimization methods; Sensitivity analysis; Simulated annealing; Temperature distribution; Uncertainty;
Conference_Titel :
High Speed Semiconductor Devices and Circuits, 1991., Proceedings IEEE/Cornell Conference on Advanced Concepts in
Conference_Location :
Ithaca, NY
Print_ISBN :
0-7803-0491-8
DOI :
10.1109/CORNEL.1991.170036
