DocumentCode
2612350
Title
Lifetimes of 800nm-Wavelength GaAlAs Semiconductor Lasers
Author
Kumada, S. ; Shimizu, H. ; Itoh, K.
Author_Institution
Matsushita Electroni¿s Corporation 1, Kotari Yakemachi, Nagaokakyo, Kyoto, Japan (617). 075-921-8151 (ext. 440)
fYear
1983
fDate
30407
Firstpage
153
Lastpage
159
Abstract
This is the first report on the lifetimes of 800nm-wavelength GaAlAs semiconductor lasers which have recently been put into mass production. The experimetal analysis are described of influences of various factors on the lifetime such as diode temperature, thermal reistance, wavelength, facet coating, surge current and electrostatic discharge. The result of this study has shown that a extrapolated mean lifetime for 800nm/ 2.5mW GaAlAs lasers at room temperature is as long as 11.5 years.
Keywords
Coatings; Degradation; Electrostatic discharge; Regression analysis; Semiconductor diodes; Semiconductor lasers; Surges; Temperature; Thermal resistance; Zinc;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1983. 21st Annual
Conference_Location
Phoenix, AZ, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1983.361977
Filename
4208498
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