DocumentCode :
2612350
Title :
Lifetimes of 800nm-Wavelength GaAlAs Semiconductor Lasers
Author :
Kumada, S. ; Shimizu, H. ; Itoh, K.
Author_Institution :
Matsushita Electroni¿s Corporation 1, Kotari Yakemachi, Nagaokakyo, Kyoto, Japan (617). 075-921-8151 (ext. 440)
fYear :
1983
fDate :
30407
Firstpage :
153
Lastpage :
159
Abstract :
This is the first report on the lifetimes of 800nm-wavelength GaAlAs semiconductor lasers which have recently been put into mass production. The experimetal analysis are described of influences of various factors on the lifetime such as diode temperature, thermal reistance, wavelength, facet coating, surge current and electrostatic discharge. The result of this study has shown that a extrapolated mean lifetime for 800nm/ 2.5mW GaAlAs lasers at room temperature is as long as 11.5 years.
Keywords :
Coatings; Degradation; Electrostatic discharge; Regression analysis; Semiconductor diodes; Semiconductor lasers; Surges; Temperature; Thermal resistance; Zinc;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1983. 21st Annual
Conference_Location :
Phoenix, AZ, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1983.361977
Filename :
4208498
Link To Document :
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