• DocumentCode
    2612350
  • Title

    Lifetimes of 800nm-Wavelength GaAlAs Semiconductor Lasers

  • Author

    Kumada, S. ; Shimizu, H. ; Itoh, K.

  • Author_Institution
    Matsushita Electroni¿s Corporation 1, Kotari Yakemachi, Nagaokakyo, Kyoto, Japan (617). 075-921-8151 (ext. 440)
  • fYear
    1983
  • fDate
    30407
  • Firstpage
    153
  • Lastpage
    159
  • Abstract
    This is the first report on the lifetimes of 800nm-wavelength GaAlAs semiconductor lasers which have recently been put into mass production. The experimetal analysis are described of influences of various factors on the lifetime such as diode temperature, thermal reistance, wavelength, facet coating, surge current and electrostatic discharge. The result of this study has shown that a extrapolated mean lifetime for 800nm/ 2.5mW GaAlAs lasers at room temperature is as long as 11.5 years.
  • Keywords
    Coatings; Degradation; Electrostatic discharge; Regression analysis; Semiconductor diodes; Semiconductor lasers; Surges; Temperature; Thermal resistance; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1983. 21st Annual
  • Conference_Location
    Phoenix, AZ, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1983.361977
  • Filename
    4208498