Title :
Lifetimes of 800nm-Wavelength GaAlAs Semiconductor Lasers
Author :
Kumada, S. ; Shimizu, H. ; Itoh, K.
Author_Institution :
Matsushita Electroni¿s Corporation 1, Kotari Yakemachi, Nagaokakyo, Kyoto, Japan (617). 075-921-8151 (ext. 440)
Abstract :
This is the first report on the lifetimes of 800nm-wavelength GaAlAs semiconductor lasers which have recently been put into mass production. The experimetal analysis are described of influences of various factors on the lifetime such as diode temperature, thermal reistance, wavelength, facet coating, surge current and electrostatic discharge. The result of this study has shown that a extrapolated mean lifetime for 800nm/ 2.5mW GaAlAs lasers at room temperature is as long as 11.5 years.
Keywords :
Coatings; Degradation; Electrostatic discharge; Regression analysis; Semiconductor diodes; Semiconductor lasers; Surges; Temperature; Thermal resistance; Zinc;
Conference_Titel :
Reliability Physics Symposium, 1983. 21st Annual
Conference_Location :
Phoenix, AZ, USA
DOI :
10.1109/IRPS.1983.361977