DocumentCode
2612537
Title
Omnidirectional morphology applied to wood defects testing by using computed tomography
Author
Qi, Dawei ; Yu, Lei
Author_Institution
Coll. of Sci., Northeast Forestry Univ., Harbin
fYear
2008
fDate
2-5 July 2008
Firstpage
868
Lastpage
873
Abstract
Wood non-destructive testing technology is a new and comprehensive subject. An approach of image edge detection based on morphology of omnidirectional and multi-scale structuring element is constructed by weighting method of morphological operation. In recent years wood non-destructive testing has achieved fast development. Computed tomography (CT) scanning technology has been applied to the detection of internal defects in the logs for the purpose of obtaining prior information, which can be used to arrive at better log sawing decision. In addition to the recognition of wood internal defects, computed tomography (CT) technology can be applied to wood non-destructive testing. Mathematical morphology of omnidirectional and multi-scale element is defined to suppress noise and adapt to different edge in the image. The results of simulation in wood image demonstrate that the method performs better not only in edge detection but also in noise-suppression than classical edge detection operator.
Keywords
computerised tomography; edge detection; mathematical morphology; nondestructive testing; production engineering computing; wood processing; CT scanning; computed tomography; image edge detection; mathematical morphology; multiscale structuring; noise suppression; omnidirectional morphology; wood defects testing; wood internal defects; wood nondestructive testing; Acoustic testing; Computed tomography; Image edge detection; Mechatronics; Morphology; Nondestructive testing; Nuclear magnetic resonance; Optical noise; Radiography; X-ray imaging; Computed tomography; Omnidirectional structure Element; Wood nondestructive testing; image processing; mathematical morphology;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Intelligent Mechatronics, 2008. AIM 2008. IEEE/ASME International Conference on
Conference_Location
Xian
Print_ISBN
978-1-4244-2494-8
Electronic_ISBN
978-1-4244-2495-5
Type
conf
DOI
10.1109/AIM.2008.4601775
Filename
4601775
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